Test pattern generation for API faults in RAM
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 37 (11) , 1426-1428
- https://doi.org/10.1109/12.8710
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Test Pattern Generation for API Faults in RAMIEEE Transactions on Computers, 1985
- Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access MemoriesIEEE Transactions on Computers, 1980
- Testing Memories for Single-Cell Pattern-Sensitive FaultsIEEE Transactions on Computers, 1980