Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories
- 1 June 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-29 (6) , 419-429
- https://doi.org/10.1109/tc.1980.1675601
Abstract
A class of pattern-sensitive faults in semiconductor random-access memories are studied. Efficient test procedures to detect and locate modeled faults are presented.Keywords
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