API Tests for RAM Chips
- 1 July 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Computer
- Vol. 10 (7) , 32-35
- https://doi.org/10.1109/c-m.1977.217778
Abstract
With 16K RAM chips already in commercial use and 64K RAM chips being planned, the increasing length of time needed to run test patterns could lead to cost increases that would offset the advantages of the larger devices. For example, many existing tests of the important pattern-sensitive-fault class, such as galloping 0's and 1's,* require a test length proportional to the square of the number of bits in the RAM chip.1-4Clearly, the time consumed by such tests looms as a major component in the overall costs of chip production.Keywords
This publication has 4 references indexed in Scilit:
- Detection oF Pattern-Sensitive Faults in Random-Access MemoriesIEEE Transactions on Computers, 1975
- Reliability of MOS LSl circuitsProceedings of the IEEE, 1974
- A 4K MOS dynamic random-access memoryIEEE Journal of Solid-State Circuits, 1973
- An 8K B random-access memory chip using the one-device FET cellIEEE Journal of Solid-State Circuits, 1973