Test Pattern Generation for API Faults in RAM
- 1 March 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-34 (3) , 284-287
- https://doi.org/10.1109/tc.1985.1676572
Abstract
In this correspondence we consider the problem of test pattern generation for random-access memory to detect pattern-sensitive faults. A test algorithm is presented which contains a near-optimal WRITE sequence and is an improvement over existing algorithms. The algorithm is well suited for built-in testing applications.Keywords
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