Double-crystal x-ray topographic studies of bulk and epitaxially grown ZnxCd1−xTe (0.0≤x≤0.06)
- 20 January 1986
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 48 (3) , 239-241
- https://doi.org/10.1063/1.96568
Abstract
The first double‐crystal topographic studies of epitaxial layers of ZnxCd1−xTe (0≤x≤0.06) grown by molecular beam epitaxy are reported in this letter. A comparison of bulk and epitaxially grown ZnCdTe clearly indicates that the epitaxial layers are of better structural quality and are more suitable for use as substrates for growth of HgCdTe.Keywords
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