The pseudoexhaustive test of sequential circuits
- 1 January 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 11 (1) , 26-33
- https://doi.org/10.1109/43.108616
Abstract
The concept of a pseudoexhaustive test for sequential circuits is introduced in a way similar to that which is used for combinational networks. Using partial scan all cycles in the data flow of a sequential circuit are removed, such that a compact combinational model can be constructed. Pseudoexhaustive test sequences for the original circuit are constructed from a pseudoexhaustive test set for this model. To make this concept feasible for arbitrary circuits a technique for circuit segmentation is presented which provides special segmentation cells as well as the corresponding algorithms for the automatic placement of the cells. Example circuits show that the test strategy requires less additional silicon area than a complete scan path. Thus the advantages of a partial scan path are combined with the well-known benefits of a pseudoexhaustive test, such as high fault coverage and simplified test generationKeywords
This publication has 15 references indexed in Scilit:
- The design of random-testable sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Generating pattern sequences for the pseudo-exhaustive test of MOS-circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Tools and devices supporting the pseudo-exhaustive testPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Generating pseudo-exhaustive vectors for external testingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Partitioning circuits for improved testabilityAlgorithmica, 1991
- Hochintegrierte Schaltungen: Prüfgerechter Entwurf und TestPublished by Springer Nature ,1991
- An analytical approach to the partial scan problemJournal of Electronic Testing, 1990
- Exhaustive Generation of Bit Patterns with Applications to VLSI Self-TestingIEEE Transactions on Computers, 1983
- Finding All the Elementary Circuits of a Directed GraphSIAM Journal on Computing, 1975
- Note—A Computational Survey of Methods for the Set Covering ProblemManagement Science, 1975