LEED investigations on the interaction of Pd and Ni with different Si(111) surfaces
- 2 September 1984
- journal article
- Published by Elsevier in Surface Science
- Vol. 145 (1) , 87-100
- https://doi.org/10.1016/0039-6028(84)90767-2
Abstract
No abstract availableKeywords
This publication has 48 references indexed in Scilit:
- Microscopic properties and behavior of silicide interfacesSurface Science, 1983
- Structural morphology and electronic properties of the Si-Cr interfacePhysical Review B, 1982
- Experimental and theoretical band-structure studies of refractory metal silicidesPhysical Review B, 1981
- Lattice-Location Experiment of the Ni-Si Interface by Thin-Crystal Channeling of Helium IonsPhysical Review Letters, 1981
- Cross-sectional transmission electron microscopy of silicon-silicide interfacesJournal of Applied Physics, 1981
- Refractory silicides for integrated circuitsJournal of Vacuum Science and Technology, 1980
- Application of Auger electron spectroscopy to studies of the silicon/silicide interfaceJournal of Vacuum Science and Technology, 1978
- Evaluation of glancing angle X-ray diffraction and MeV 4He backscattering analyses of silicide formationThin Solid Films, 1974
- Studies of formation of silicides and their barrier heights to siliconPhysica Status Solidi (a), 1973
- Characterization of polycrystalline layers by channelling measurementsThin Solid Films, 1973