Studies of formation of silicides and their barrier heights to silicon

This publication has 12 references indexed in Scilit:

• Alloying of thin palladium films with single crystal and amorphous silicon
  Physica Status Solidi (a), 1973
• Analysis of formation of hafnium silicide on silicon
  Applied Physics Letters, 1973
• Growth Kinetics Observed in the Formation of Metal Silicides on Silicon
  Applied Physics Letters, 1972
• Hafnium-Silicon Schottky Barriers: Large Barrier Height on p-Type Silicon and Ohmic Behavior on n-Type Silicon
  Applied Physics Letters, 1971
• LOW-TEMPERATURE MIGRATION OF SILICON IN THIN LAYERS OF GOLD AND PLATINUM
  Applied Physics Letters, 1971
• Analysis of amorphous layers on silicon by backscattering and channeling effect measurements
  Surface Science, 1970
• Characteristics of aluminum-silicon schottky barrier diode
  Solid-State Electronics, 1970
• Interstitial Alloys
  Published by Springer Nature ,1967
• Metal-semiconductor surface barriers
  Solid-State Electronics, 1966
• The Analysis of Photoelectric Sensitivity Curves for Clean Metals at Various Temperatures
  Physical Review B, 1931