Alloying of thin palladium films with single crystal and amorphous silicon
- 16 February 1973
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 15 (2) , 645-651
- https://doi.org/10.1002/pssa.2210150235
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Rutherford Scattering and Channeling: A Useful Combination for Studying Crystal SurfacesJournal of Vacuum Science and Technology, 1971
- Analysis of amorphous layers on silicon by backscattering and channeling effect measurementsSurface Science, 1970