The state-of-the-art in SOI technology

This publication has 12 references indexed in Scilit:

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• High-temperature silicon-on-insulator electronics for space nuclear power systems: requirements and feasibility
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• Recent advances in solid-phase epitaxial recrystallization of SOS with applications to CMOS and bipolar devices
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• SIMOX SOI for integrated circuit fabrication
  IEEE Circuits and Devices Magazine, 1987
• Electrical and radiation characterization of three SOI material technologies
  IEEE Circuits and Devices Magazine, 1987
• Trade-Offs For RAD-Hard Soi Structures
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• Subthreshold slope of thin-film SOI MOSFET's
  IEEE Electron Device Letters, 1986
• Growth of Electronic Quality Silicon Over SiO2 by Epitaxial Lateral Overgrowth Technique
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• Effects of ionizing radiation on n-channel MOSFET's fabricated in zone-melting-recrystallized Si films on SiO₂
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• Total Dose Radiation-Bias Effects in Laser-Recrystallized SOI MOSFET's
  IEEE Transactions on Nuclear Science, 1982