Procurement specification requirements for protection against electromigration failures in aluminium metallizations
- 1 January 1979
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 19 (3) , 207-218
- https://doi.org/10.1016/0026-2714(79)90335-4
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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