Depth profiles and microtopology
- 15 December 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 218 (1-3) , 53-56
- https://doi.org/10.1016/0167-5087(83)90954-7
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Glancing angle measurements of oxygen depth profilesNuclear Instruments and Methods in Physics Research, 1981
- Effects of surface roughness on backscattering spectraNuclear Instruments and Methods, 1980
- Surface topology using rutherford backscatteringNuclear Instruments and Methods, 1980
- The optimization of a rutherford backscattering geometry for enhanced depth resolutionNuclear Instruments and Methods, 1975
- Backscattering measurements and surface roughnessNuclear Instruments and Methods, 1974