Are there any alternatives to "known good die" ? [MCMs]

Publisher Website

17 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/mcmc.1994.292519

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

Built-in current testing-feasibility study
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
Smart-substrate multichip-module systems
IEEE Design & Test of Computers, 1994
High-yield assembly of multichip modules through known-good IC's and effective test strategies
Proceedings of the IEEE, 1992