Interaction between a spherical probe and an atomic lattice: implication for atomic force microscopy on graphite and diamond
- 1 August 1990
- journal article
- Published by Elsevier in Surface Science
- Vol. 234 (1-2) , 181-196
- https://doi.org/10.1016/0039-6028(90)90676-y
Abstract
No abstract availableKeywords
This publication has 32 references indexed in Scilit:
- Summary Abstract: Atomic force microscopy studies of frictional forces and of force effects in scanning tunneling microscopyJournal of Vacuum Science & Technology A, 1988
- Atomic resolution atomic force microscopy of graphite and the ‘‘native oxide’’ on siliconJournal of Vacuum Science & Technology A, 1988
- Scanning tunneling microscopy and atomic force microscopy of the liquid–solid interfaceJournal of Vacuum Science & Technology A, 1988
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Experimental Observation of Forces Acting during Scanning Tunneling MicroscopyPhysical Review Letters, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986
- Van der Waals Forces: Theory and ExperimentPublished by Elsevier ,1973
- van der Waals dispersion force contribution to works of adhesion and contact angles on the basis of macroscopic theoryJournal of the Chemical Society, Faraday Transactions 2: Molecular and Chemical Physics, 1973
- The general theory of van der Waals forcesAdvances in Physics, 1961
- The London—van der Waals attraction between spherical particlesPhysica, 1937