Sims Characterization of Thin Thermal Oxide Layers on Polycrystalline Aluminium

This publication has 8 references indexed in Scilit:

• Oxygen coverage effects in SIMS quantitative analysis using a primary rastered probe
  Surface and Interface Analysis, 1985
• A model calculation of the auger depth profile at a sharp interface of two homogeneous substances and its comparison with the experimental depth profile of an aluminium oxide — aluminium interface
  Surface Science, 1984
• A photo-electron and secondary ion mass spectrometric study of the chemical composition of thermal oxide layers on technically pure aluminium
  Corrosion Science, 1983
• The depth dependence of the depth resolution in sputter profiling
  Surface and Interface Analysis, 1982
• Magnesium diffusion in several aluminum alloys
  Applications of Surface Science, 1981
• Use of the IMS-3f High Mass Resolving Power
  Published by Springer Nature ,1979
• Growth of MgO films with high secondary electron emission on Al-Mg alloys
  Surface Science, 1978
• Primary oxygen ion implantation effects on depth profiles by secondary ion emission mass spectrometry
  Applied Physics Letters, 1973