Aging behavior and recovery of polarization in Sr0.8Bi2.4Ta2O9 thin films

This publication has 23 references indexed in Scilit:

• Electrode-induced degradation of Pb(ZrxTi1−x)O3 (PZT) polarization hysteresis characteristics in Pt/PZT/Pt ferroelectric thin-film capacitors
  Applied Physics Letters, 1996
• Characteristics of spin-on ferroelectric SrBi₂Ta₂O₉ thin film capacitors for ferroelectric random access memory applications
  Journal of Materials Research, 1996
• Qualitative model for the fatigue-free behavior of SrBi2Ta2O9
  Applied Physics Letters, 1996
• Preparation of Bi-Based Ferroelectric Thin Films by Sol-Gel Method
  Japanese Journal of Applied Physics, 1995
• Electrochemical models of failure in oxide perovskites
  Integrated Ferroelectrics, 1993
• Ferroelectric Memories
  Science, 1989
• The aging behaviour of the complex material parameters ε, d and s in ferroelectric PZT ceramics
  Ferroelectrics, 1987
• Aging in Tetragonal Ferroelectric Barium Titanate
  Journal of the American Ceramic Society, 1969
• The Aging Characteristics in Perovskite-Type Ferroelectric Ceramics
  Japanese Journal of Applied Physics, 1968
• Aging of the Properties of Barium Titanate and Related Ferroelectric Ceramics
  The Journal of the Acoustical Society of America, 1955