On-wafer high-frequency device characterization
- 30 September 1992
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 19 (1-4) , 679-686
- https://doi.org/10.1016/0167-9317(92)90521-r
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- A three-step method for the de-embedding of high-frequency S-parameter measurementsIEEE Transactions on Electron Devices, 1991
- New formulation of the current and charge relations in bipolar transistor modeling for CACD purposesIEEE Transactions on Electron Devices, 1985
- Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network AnalyzerIEEE Transactions on Microwave Theory and Techniques, 1979