Reconstructions and phase transitions of Ge on the Si(111)7 × 7 surface: I. Structural changes
- 2 November 1989
- journal article
- Published by Elsevier in Surface Science
- Vol. 222 (1) , 38-46
- https://doi.org/10.1016/0039-6028(89)90333-6
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Thin epitaxial Ge−Si(111) films: Study and control of morphologySurface Science, 1987
- Geometrical Structures of the Ge/Si(111) Interface and the Si(111) (7×7) SurfacePhysical Review Letters, 1986
- Photoemission study of Si(111)-Ge(5×5) surfacesPhysical Review B, 1986
- Growth and surface structure of Ge–Si alloy films on Si(111)-(7×7)Journal of Vacuum Science & Technology A, 1986
- Tunneling images of the 5×5 surface reconstruction on Ge-Si(111)Physical Review B, 1985
- Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffractionSurface Science, 1985
- New adatom model for Si(111) 7×7 and Si(111)-Ge 5×5 reconstructed surfacesPhysical Review B, 1984
- Structural analogy between GeSi(111)-5 × 5 and Si(111)-7 × 7 surfacesSurface Science, 1984
- Rheed study on the Ge/Si(111) and Si/Ge(111) systems: Reaction of Ge with the Si(111)(7 × 7) surfaceSurface Science, 1984
- Heteroepitaxial Growth and Superstructure of Ge on Si(111)–7×7 and (100)–2×1 SurfacesJapanese Journal of Applied Physics, 1983