Structural analogy between GeSi(111)-5 × 5 and Si(111)-7 × 7 surfaces
- 2 October 1984
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 146 (1) , L540-L546
- https://doi.org/10.1016/0039-6028(84)90217-6
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- High energy transmission electron diffraction and imaging studies of the silicon (111) 7 × 7 surface structureUltramicroscopy, 1983
- Structure Analysis of the Si(111)7 × 7 Surface by Low-Energy Ion ScatteringPhysical Review Letters, 1983
- Surface stacking sequence and (7 × 7) reconstruction at Si(111) surfacesPhysical Review B, 1983
- "Surface Dislocation" Process for Surface Reconstruction and Its Application to the Silicon (111) 7×7 ReconstructionPhysical Review Letters, 1983
- LEED/AES Studies of the Ge on Si(111)7×7 SurfaceJapanese Journal of Applied Physics, 1983
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983
- Structure of Si(111)-(7×7)HPhysical Review Letters, 1981
- Characteristic energies in secondary electron spectra from Si(111) surfacesSurface Science, 1971
- Influence of impurities on the surface structures and fault generation in homoepitaxial Si (111) filmsSurface Science, 1971
- LEED investigations of clean and Au-stabilised Si surfacesSurface Science, 1970