Interconnection Transmission Line Parameter Characterization
- 1 December 1992
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Calibrating On-Wafer Probes to the Probe TipsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1992
- Planar Resistors for Probe Station CalibrationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1992
- A general waveguide circuit theoryJournal of Research of the National Institute of Standards and Technology, 1992
- S-parameter-based IC interconnect transmission line characterizationIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1992
- Comparison of On-Wafer CalibrationsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1991
- Transmission line capacitance measurementIEEE Microwave and Guided Wave Letters, 1991
- A multiline method of network analyzer calibrationIEEE Transactions on Microwave Theory and Techniques, 1991
- Characteristic impedance determination using propagation constant measurementIEEE Microwave and Guided Wave Letters, 1991