S-parameter-based IC interconnect transmission line characterization

This publication has 7 references indexed in Scilit:

• A three-step method for the de-embedding of high-frequency S-parameter measurements
  IEEE Transactions on Electron Devices, 1991
• Crosstalk analysis of interconnection lines and packages in high-speed integrated circuits
  IEEE Transactions on Circuits and Systems, 1990
• Modeling of multiconductor buses and analysis of crosstalk, propagation delay and pulse distortion in high speed GaAs logic circuits
  IEEE Transactions on Microwave Theory and Techniques, 1989
• Waveform degradation in VLSI interconnections
  IEEE Journal of Solid-State Circuits, 1989
• The modeling of resistive interconnects for integrated circuits
  IEEE Journal of Solid-State Circuits, 1983
• Properties of interconnection on silicon, sapphire, and semi-insulating gallium arsenide substrates
  IEEE Transactions on Electron Devices, 1982
• Properties of Microstrip Line on Si-SiO/sub 2/ System
  IEEE Transactions on Microwave Theory and Techniques, 1971