1.15-μm wavelength oxide-confined quantum-dot vertical-cavity surface-emitting laser

Abstract
Low-threshold lasing is achieved at 1.154 /spl mu/m for an oxide-confined quantum-dot (QD) vertical-cavity surface-emitting laser (VCSEL) grown on a GaAs substrate. The long wavelength emission is obtained through use of an InAs-GaAs QD active region. A continuous-wave (CW) threshold of 502 /spl mu/A is obtained for a device size of 10-/spl mu/m diameter, corresponding to a threshold current density of 640 A/cm/sup 2/.