Characterizing the layer properties of AlGaAs/GaAs heteroface solar cell structures by specular spectral reflectance
- 1 April 2000
- journal article
- research article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 29 (4) , 436-442
- https://doi.org/10.1007/s11664-000-0157-6
Abstract
No abstract availableKeywords
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