An Electron Microscopic Examination of the Amyloplast Membranes from a Potato Seedling Resistant and a Processing Potato Cultivar Susceptible to Low Temperature Sweetening
- 1 June 1990
- journal article
- research article
- Published by Elsevier in Canadian Institute of Food Science and Technology Journal
- Vol. 23 (2-3) , 145-148
- https://doi.org/10.1016/s0315-5463(90)70220-9
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- A low-viscosity epoxy resin embedding medium for electron microscopyPublished by Elsevier ,2004
- Influence of potato storage and handling stress on sugars, chip quality and integrity of the starch (amyloplast) membraneAmerican Journal of Potato Research, 1987
- Effect of Low Temperature Storage on Sugar Concentrations and Chip Color of Certain Processing Potato Cultivars and SelectionsJournal of Food Science, 1987
- Integrity of Amyloplast Membranes in Stored Potato TubersZeitschrift für Pflanzenphysiologie, 1978
- Mechanism of starch-sugar interconversion in Solanum tuberosumPhytochemistry, 1976
- CELL DISRUPTION AND ITS CONSEQUENCES IN FOOD PROCESSINGJournal of Food Science, 1972
- Biogenesis and Degradation of StarchPlant Physiology, 1971
- Norchip, a new early maturing chipping variety with high total solidsAmerican Journal of Potato Research, 1969
- The sugar balance in some British potato varieties during storage. II. The effects of tuber age, previous storage temperature, and intermittent refrigeration upon low-temperature sweeteningPotato Research, 1969