Peak-to-valley current ratios as high as 50:1 at room temperature in pseudomorphic In0.53Ga0.47As/AlAs/InAs resonant tunneling diodes

Abstract
Pseudomorphic In0.53Ga0.47As/AlAs/InAs resonant tunneling diodes with the highest peak‐to‐valley current ratios reported to date have been fabricated on InP substrates with molecular beam epitaxy. Peak‐to‐valley current ratios as high as 50:1 at 300 K are obtained. The majority of the devices on the sample have a peak‐to‐valley current ratio of 42 at 300 K and 85 at 77 K.