Substrate dependence of structural and transport properties of R.F. sputtered pbte films
- 31 December 1983
- journal article
- Published by Elsevier in Materials Research Bulletin
- Vol. 18 (12) , 1443-1449
- https://doi.org/10.1016/0025-5408(83)90182-4
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Structural properties of PbTe films studied by X-ray asymmetric reflectionsJournal of Crystal Growth, 1982
- Application of asymmetric reflections to the X-ray study of structural deformation of surfacesThin Solid Films, 1981
- Mobility and photoconductive response speed improvement by annealing in thin film infrared detectors of PbxSn1−xTe obtained by R.F. SputteringInfrared Physics, 1979
- Nonlinearity Measurements Using Alternating CurrentActive and Passive Electronic Components, 1978