The effects of architecture and process on the hardness of programmable technologies
- 1 December 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 46 (6) , 1736-1743
- https://doi.org/10.1109/23.819147
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Impact of ion energy on single-event upsetIEEE Transactions on Nuclear Science, 1998
- Challenges in hardening technologies using shallow-trench isolationIEEE Transactions on Nuclear Science, 1998
- Emerging radiation hardness assurance (RHA) issues: a NASA approach for space flight programsIEEE Transactions on Nuclear Science, 1998
- Current radiation issues for programmable elements and devicesIEEE Transactions on Nuclear Science, 1998
- Comparative SEU sensitivities to relativistic heavy ionsIEEE Transactions on Nuclear Science, 1998