Emerging radiation hardness assurance (RHA) issues: a NASA approach for space flight programs

This publication has 8 references indexed in Scilit:

• Single event functional interrupt (SEFI) sensitivity in microcircuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Heavy ion, proton and Co-60 radiation evaluation of 16 Mbit DRAM memories for space application
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Radiation effects in advanced microelectronics technologies
  IEEE Transactions on Nuclear Science, 1998
• Radiation effects on current field programmable technologies
  IEEE Transactions on Nuclear Science, 1997
• Radiation effect characterization and test methods of single-chip and multi-chip stacked 16 Mbit DRAMs
  IEEE Transactions on Nuclear Science, 1996
• Single-event-effect mitigation from a system perspective
  IEEE Transactions on Nuclear Science, 1996
• Space radiation evaluation of 16 Mbit DRAMs for mass memory applications
  IEEE Transactions on Nuclear Science, 1994
• SEU hardening of field programmable gate arrays (FPGAs) for space applications and device characterization
  IEEE Transactions on Nuclear Science, 1994