Single-event-effect mitigation from a system perspective

This publication has 22 references indexed in Scilit:

• Observation of heavy ion induced transients in linear circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Single event effect proton and heavy ion test results for candidate spacecraft electronics
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Single event effects testing of the Crystal CS5327 16-bit ADC
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Single event effect ground test results for a fiber optic data interconnect and associated electronics
  IEEE Transactions on Nuclear Science, 1994
• Single event effects in analog-to-digital converters: device performance and system impact
  IEEE Transactions on Nuclear Science, 1994
• Particle-induced bit errors in high performance fiber optic data links for satellite data management
  IEEE Transactions on Nuclear Science, 1994
• SEDS MIL-STD-1773 fiber optic data bus: Proton irradiation test results and spaceflight SEU data
  IEEE Transactions on Nuclear Science, 1993
• Observation of single event upsets in analog microcircuits
  IEEE Transactions on Nuclear Science, 1993
• Transient SEUs in a fiber optic system for space applications
  IEEE Transactions on Nuclear Science, 1991
• Transient radiation test techniques for high-speed analog-to-digital converters
  IEEE Transactions on Nuclear Science, 1989