Relationship between the non linear dynamic behaviour of an oscillating tip–microlever system and the contrast at the atomic scale
- 1 February 1999
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 140 (3-4) , 333-338
- https://doi.org/10.1016/s0169-4332(98)00550-9
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This publication has 13 references indexed in Scilit:
- The Relation between Resonance Curves and Tip-Surface Interaction Potential in Noncontact Atomic-Force MicroscopyJapanese Journal of Applied Physics, 1998
- Hysteresis generated by attractive interaction: oscillating behavior of a vibrating tip–microlever system near a surfaceSurface Science, 1998
- Forces and frequency shifts in atomic-resolution dynamic-force microscopyPhysical Review B, 1997
- Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspectsPhysical Review B, 1996
- Generic Behavior of Grazing Impact OscillatorsPhysical Review Letters, 1996
- Observation of Silicon Surfaces Using Ultrahigh-Vacuum Noncontact Atomic Force MicroscopyJapanese Journal of Applied Physics, 1996
- Surface Reconstruction of the Lamellar Morphology in a Symmetric Poly(styrene-block-butadiene-block-methyl methacrylate) Triblock Copolymer: A Tapping Mode Scanning Force Microscope StudyMacromolecules, 1996
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987