Electrical properties of DX centers in GaAs and AlGaAs
- 1 December 1989
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects and Defects in Solids
- Vol. 111-112 (1-2) , 281-298
- https://doi.org/10.1080/10420158908213003
Abstract
The DX center, the lowest energy state of the donor in AIGaAs with x < 0.22, is responsible for the reduced conductivity as well as the persistent photoconductivity observed in this material at low temperature. Extensive studies of the properties of this deep level in Si-doped AIGaAs are reviewed here. Data are presented showing that the characteristics of the DX center remain essentially unchanged when it is resonant with the conduction band (x < 0.22) and that, independent of other compensation mechanisms, the DX center therefore limits the free carrier concentration in Si-doped GaAs to a maximum of about 2 × 1019 cm−3. Recent measurements suggesting that the lattice relaxation involves the motion of the Si atom from the substitutional site toward an interstitial site are also presented. Evidence for the negative U model, that the DX level is the two electron state of the substitutional donor, is discussed.Keywords
This publication has 59 references indexed in Scilit:
- A Model for DX Centers: Bond Reconstruction due to Local Random Donor-Host Atom Configurations in Mixed Semiconductor AlloysJapanese Journal of Applied Physics, 1985
- Shallow and deep donors in direct-gap -type grown by molecular-beam epitaxyPhysical Review B, 1984
- Comprehensive analysis of Si-doped (): Theory and experimentsPhysical Review B, 1984
- Electrical Properties of Si-Doped AlxGa1-xAs Layers Grown by MBEJapanese Journal of Applied Physics, 1982
- Si and Sn Doping in AlxGa1-xAs Grown by MBEJapanese Journal of Applied Physics, 1982
- Optical Properties of Williams DomainJapanese Journal of Applied Physics, 1982
- Non‐Γ Deep Levels and the Conduction Band Structure of Ga1−xAlxAs AlloysPhysica Status Solidi (b), 1981
- Trapping characteristics and a donor-complex () model for the persistent-photoconductivity trapping center in Te-dopedPhysical Review B, 1979
- Large-Lattice-Relaxation Model for Persistent Photoconductivity in Compound SemiconductorsPhysical Review Letters, 1977
- Long-lifetime photoconductivity effect in n-type GaAlAsApplied Physics Letters, 1977