Proton-induced X-ray fluorescence of thick samples in air for trace elemental analysis
- 31 January 1979
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 158, 587-594
- https://doi.org/10.1016/s0029-554x(79)96290-6
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Specimen preparation in PIXE analysisNuclear Instruments and Methods, 1977
- Proton induced X-ray emission analysis of biological samples: Some approaches and applicationsNuclear Instruments and Methods, 1977
- Proton-induced X-ray emission analysis of thick and thin targetsNuclear Instruments and Methods, 1977
- The influence of matrix effects on absolute analysis using pixeNuclear Instruments and Methods, 1977
- Use of external beam in PIXENuclear Instruments and Methods, 1977
- Determination of trace transition elements in solids by proton induced x-ray emission analysisAnalytical Chemistry, 1977
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- Use of X-ray fluorescence for chemical analysisJournal of Physics E: Scientific Instruments, 1974
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970
- Atomic Fluorescence YieldsReviews of Modern Physics, 1966