Ballistic-electron emission microscopy study of the Au/Si(111)7×7 and Au/CaF2/Si(111)7×7 interfaces
- 25 April 1994
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 64 (17) , 2300-2302
- https://doi.org/10.1063/1.111650
Abstract
Ballistic‐electron emission microscopy (BEEM) has been performed on Au/n‐Si(111)7×7 and Au/CaF2/n‐Si(111)7×7 in UHV. In both cases, the topography of the Au surface is characterized by ≊2.5 Å height terraces, stacked in several stages, with rounded shapes for Au/Si, and hexagonal shapes for Au/CaF2/Si. BEEM up to tip voltages of 8 V on Au/Si is not altering the ballistic transmissivity, in contrast to previous work on Au/Si interfaces which involved chemical preparations of the Si surfaces. The shape of the BEEM spectra on Au/CaF2/Si depends on spectral features of the density of states of the CaF2 thin film.Keywords
This publication has 23 references indexed in Scilit:
- Direct determination of impact ionization quantum yield in Si by ballistic-electron-emission microscopyPhysical Review Letters, 1994
- Hot electron scattering processes in metal films and at metal-semiconductor interfacesPhysical Review Letters, 1993
- Structural transitions of the/Si(111) interfacePhysical Review Letters, 1993
- Hot electron interactions at the passivated gold-silicon interfacePhysical Review Letters, 1992
- Optical properties of acrystalPhysical Review B, 1992
- Phonon scattering and quantum mechanical reflection at the Schottky barrierJournal of Applied Physics, 1991
- Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfacesPhysical Review B, 1991
- Scanning tunneling microscopy of insulators: CaF2 epitaxy on Si (111)Applied Physics Letters, 1989
- Electron heating by lower hybrid waves in the PLT tokamakPhysical Review Letters, 1988
- Photoemission study of bonding at the-on-Si(111) interfacePhysical Review B, 1987