In Situ, Real-Time Analysis of the Growth of Ferroelectric and Conductive Oxide Heterostructures by a New Time-of-Flight Pulsed Ion Beam Surface Analysis Technique
- 1 January 1994
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Ferroelectric La-Sr-Co-O/Pb-Zr-Ti-O/La-Sr-Co-O heterostructures on silicon via template growthApplied Physics Letters, 1993
- Multicomponent and Multilayered Thin Films for Advanced Microtechnologies: Techniques, Fundamentals, and DevicesPublished by Defense Technical Information Center (DTIC) ,1993
- Low temperature perovskite formation of lead zirconate titanate thin films by a seeding processJournal of Materials Research, 1993
- Multicomponent and Multilayered Thin Films for Advanced Microtechnologies: Techniques, Fundamentals and DevicesPublished by Springer Nature ,1993
- Electrical and reliability properties of PZT thin films for ULSI DRAM applicationsIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 1991
- Ferroelectric MemoriesScience, 1989