Lateral, normal, and longitudinal spring constants of atomic force microscopy cantilevers
- 1 August 1994
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (8) , 2527-2531
- https://doi.org/10.1063/1.1144646
Abstract
For a V-shaped atomic force microscopy cantilever beam, the spring constants in the three principal directions are given in terms of the beam geometry and material properties. For the lateral stiffness, a closed-formed expression is presented. Also, the normal and the longitudinal stiffness are obtained from a few simple equations. The results are compared with a finite element study and found to be very accurate. All spring constants depend strongly on the cantilever thickness, which is difficult to measure. In addition, the lateral and longitudinal stiffness are sensitive to the location and the height of the attached pyramid.Keywords
This publication has 11 references indexed in Scilit:
- Experimental Determination of Spring Constants in Atomic Force MicroscopyLangmuir, 1994
- Theoretical analysis of the static deflection of plates for atomic force microscope applicationsJournal of Applied Physics, 1993
- A nondestructive method for determining the spring constant of cantilevers for scanning force microscopyReview of Scientific Instruments, 1993
- Friction and wear of Langmuir-Blodgett films observed by friction force microscopyPhysical Review Letters, 1992
- Measuring electrostatic, van der Waals, and hydration forces in electrolyte solutions with an atomic force microscopeBiophysical Journal, 1991
- Direct measurement of colloidal forces using an atomic force microscopeNature, 1991
- Imaging Crystals, Polymers, and Processes in Water with the Atomic Force MicroscopeScience, 1989
- Novel optical approach to atomic force microscopyApplied Physics Letters, 1988
- Atomic-scale friction of a tungsten tip on a graphite surfacePhysical Review Letters, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986