Dielectric breakdown of Ag2S in the Au-Ag2S-Ag system
- 1 May 1976
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 47 (5) , 1808-1811
- https://doi.org/10.1063/1.322896
Abstract
Electrical breakdown of tarnish films (Ag2S) on silver has been investigated in the Au‐Ag2S‐Ag system. Dielectric breakdown in the Au‐Ag2S‐Ag system is polarity sensitive and depends on the rate of application of voltage to the film. Breakdown is consistent with multiple electron avalanche processes. Data indicate intrinsic breakdown fields greater than 3×105 V/cm (for fast rise time voltages). For slow rise time voltages, breakdown is strongly affected by silver ion mobility and becomes polarity dependent. The conductivity ratio (σAgrich/σSrich) has been obtained as a function of time and the average Ag ion mobility (2×10−8 cm2/V sec) has been determined.This publication has 11 references indexed in Scilit:
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