Detailed X-ray diffraction study of titanium nitride coatings: Some interpretation problems
- 31 October 1988
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 104, 223-234
- https://doi.org/10.1016/0025-5416(88)90424-7
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Dependence of microstructure of TiN coatings on their thicknessThin Solid Films, 1988
- Structure of TiN coatings deposited at relatively high rates and low temperatures by magnetron sputteringThin Solid Films, 1988
- Method for complex X-ray diffraction analysis of TiN coatingsCrystal Research and Technology, 1987
- X-ray analysis of strain in titanium nitride layersThin Solid Films, 1987
- Determination of the Elastic Constants of Inhomogeneous Materials with X-ray diffractionMaterials Science and Engineering, 1985
- Structure and properties of TiN coatingsThin Solid Films, 1985
- The stress in ion-plated HfN and TiN coatingsThin Solid Films, 1985
- A Useful Guide for X-Ray Stress Evaluation (XSE)Published by Springer Nature ,1984
- Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadeningJournal of Applied Crystallography, 1982
- Determination of Twin Fault Probabilities from the Diffraction Patterns of fcc Metals and AlloysJournal of Applied Physics, 1962