Photocurrents Through Thin Polymer Films
- 1 September 1969
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 40 (10) , 3958-3961
- https://doi.org/10.1063/1.1657124
Abstract
Polymer films deposited by electron-beam bombardment were sandwiched between aluminum electrode films. Photocurrents through these sandwiches, with thicknesses between 150 and 300 Å, were measured in the range of photon energies from 2 to 5 eV and with applied voltage bias up to 3 V. The photocurrent vs bias characteristics are symmetrical about the origin. The photocurrent increases with photon energy at fixed bias, with a threshold photon energy of about 2.2 eV, which is independent of the bias. The optical absorption of the polymer shows approximately the same threshold. These results are discussed in terms of the band structure of amorphous semiconductors.This publication has 5 references indexed in Scilit:
- Electronic Properties of Amorphous MaterialsScience, 1967
- Photocurrents Through Thin Films of Al2O3Journal of Applied Physics, 1965
- Electrical Properties of Thin Polymer Films. Part I. Thickness 500–2500 ÅJournal of Applied Physics, 1964
- Electrical Properties of Thin Polymer Films. Part II. Thickness 50–150 ÅJournal of Applied Physics, 1964
- Formation of Thin Polymer Films by Electron BombardmentJournal of Applied Physics, 1960