X-ray detection efficiency of a silicon surface barrier detector using synchrotron radiation in the 0.06–0.9 keV energy region
- 1 April 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 289 (1-2) , 317-321
- https://doi.org/10.1016/0168-9002(90)90275-b
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Detection characteristics of microchannel plates and gold photocathodes for plasma x‐ray diagnostics [near the absorption edges (2–8) keV)] (abstract)Review of Scientific Instruments, 1989
- Quantum efficiency of gold photocathodes (2–8 keV) and EXAFS in its secondary electron yield and in the detection currents of a microchannel plate and a silicon surface barrier detectorReview of Scientific Instruments, 1988
- Determination of the structure of magnetic islands on TFTR (invited)Review of Scientific Instruments, 1988
- X-ray response of silicon surface-barrier diodes at 8 and 17.5 keV: Evidence that the x-ray sensitive depth is not generally the depletion depthReview of Scientific Instruments, 1988
- Current response characteristics of microchannel plates x-ray detector using synchrotron radiation (0.6–2 keV and 5–20 keV)Review of Scientific Instruments, 1988
- X-ray attenuation cross sections for energies 100 eV to 100 keV and elements Z = 1 to Z = 92Atomic Data and Nuclear Data Tables, 1988
- Toroidal plasma production by electron cyclotron heating in the WT-2 deviceNuclear Fusion, 1986
- Partial and major disruptions in the JIPP T-II tokamakNuclear Fusion, 1985
- Soft X-ray tomography in the JIPP T-II stellaratorNuclear Fusion, 1982
- Low-energy x-ray interaction coefficients: Photoabsorption, scattering, and reflectionAtomic Data and Nuclear Data Tables, 1982