Structural changes of evaporated tantalum during film growth
- 2 April 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 90 (1) , 43-50
- https://doi.org/10.1016/0040-6090(82)90069-4
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- UHV – Deposited Amorphous Tantalum and Tantalum–Nickel FilmsActive and Passive Electronic Components, 1977
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- The mean free path of electrons in metalsAdvances in Physics, 1952