Reliability of scrubbing recovery-techniques for memory systems
- 1 April 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 39 (1) , 114-122
- https://doi.org/10.1109/24.52622
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Fault-Tolerant Semiconductor MemoriesComputer, 1984
- Fault-Tolerant Design Techniques for Semiconductor Memory ApplicationsIBM Journal of Research and Development, 1984
- Reliability and Performance of Error-Correcting Memory and Register ArraysIEEE Transactions on Computers, 1980
- Single Event Upset of Dynamic Rams by Neutrons and ProtonsIEEE Transactions on Nuclear Science, 1979
- Cosmic Ray-Induced Soft Errors in Static MOS Memory CellsIEEE Transactions on Nuclear Science, 1979
- Cosmic Ray Induced in MOS Memory CellsIEEE Transactions on Nuclear Science, 1978