Fault-Tolerant Semiconductor Memories

This publication has 21 references indexed in Scilit:

• A DESIGN FOR PROCESS STATE PRESERVATION ON STORAGE UNIT FAILURE
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Fault-Tolerant 256K Memory Designs
  IEEE Transactions on Computers, 1984
• A submicron VLSI memory with a 4b-at-a-time built-in ECC circuit
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1984
• Code Constructions for Error Control in Byte Organized Memory Systems
  IEEE Transactions on Computers, 1983
• A 1-Mbit Full-Wafer MOS RAM
  IEEE Journal of Solid-State Circuits, 1980
• A New Class of Error-Correcting/Detecting Codes for Fault-Tolerant Computer Applications
  IEEE Transactions on Computers, 1980
• A Reliable Spaceborne Memory with a Single Error and Erasure Correction Scheme
  IEEE Transactions on Computers, 1979
• Reliability Modeling and Analysis of Fault-Tolerant Memories
  IEEE Transactions on Reliability, 1978
• Lookaside Techniques for Minimum Circuit Memory Translators
  IEEE Transactions on Computers, 1973
• Error Detecting and Error Correcting Codes
  Bell System Technical Journal, 1950