Surface characterization by RHEED techniques during MBE growth of GaAs and AlxGa1−xAs
- 1 January 1991
- journal article
- Published by Elsevier in Superlattices and Microstructures
- Vol. 9 (2) , 141-145
- https://doi.org/10.1016/0749-6036(91)90270-2
Abstract
No abstract availableKeywords
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