Electro-optic sampling using an aluminum gallium arsenide probe

12 April 1993

journal article
research article
Published by AIP Publishing in Applied Physics Letters

Vol. 62 (15) , 1733-1735
https://doi.org/10.1063/1.109589

Abstract

We demonstrate a new electro‐optic sampling probe with femtosecond resolution. The probe is a 7‐μm‐thick film of 80% AlGaAs used in both total internal reflecting and free‐standing geometries. A thin‐film probe eliminates many of the problems associated with the use of bulk crystals as electro‐optic sensors.

Keywords

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