Extended X-Ray Absorption Fine Structure in Photoelectron Emission
- 17 September 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 53 (12) , 1183-1186
- https://doi.org/10.1103/physrevlett.53.1183
Abstract
We report the first definitive measurements of extended x-ray absorption fine structure (EXAFS) made by monitoring the direct photoelectron emission as a function of photon energy. We have measured EXAFS associated with the Mn and F core levels in evaporated films of Mn and found good agreement with bulk transmission EXAFS associated with the Mn level. Photoelectron EXAFS makes possible surface-sensitive structural determinations using vacuum uv radiation on a virtually unlimited range of systems.
Keywords
This publication has 14 references indexed in Scilit:
- Surface-structure determinations by means of off-normal photoelectron diffraction: A kinematical analysisPhysical Review B, 1983
- Direct Surface Structure Determination with Photoelectron DiffractionPhysical Review Letters, 1983
- Extended-fine-structure analysis of oxygen on titaniumJournal of Vacuum Science & Technology A, 1983
- Extended x-ray absorption fine structure—its strengths and limitations as a structural toolReviews of Modern Physics, 1981
- Photon-energy dependence of the core-level peak intensity in photoelectron spectra: A study of the extended fine structurePhysical Review B, 1980
- Extended Appearance-Potential Fine-Structure Analysis: Oxygen on Al(100)Physical Review Letters, 1980
- Nearest-Neighbor Backscattering Effects in Angle-Integrated Photoemission Spectroscopy of Core LevelsPhysical Review Letters, 1979
- Surface extended x-ray absorption fine structure in the soft-x-ray region: Study of an oxidized Al surfacePhysical Review B, 1978
- Extended X-Ray-Absorption Fine Structure of Surface Atoms on Single-Crystal Substrates: Iodine Adsorbed on Ag(111)Physical Review Letters, 1978
- Possibility of adsorbate position determination using final-state interference effectsPhysical Review B, 1976