High energy heavy-ion induced X-ray emission analysis
- 15 April 1977
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 142 (1-2) , 111-119
- https://doi.org/10.1016/0029-554x(77)90818-7
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- The capabilities of proton induced X-ray fluorescence in analytical chemistryJournal of Radioanalytical and Nuclear Chemistry, 1975
- Trace element analysis of fluids by proton-induced x-ray fluorescence spectrometryAnalytical Chemistry, 1975
- Proton induced X-ray emission as a tool for trace element analysisNuclear Instruments and Methods, 1974
- An assessment of ion-induced X-rays for analysisThin Solid Films, 1973
- TargetDependence of ProjectileX-Ray Production Cross Sections in High-Energy, Heavy-Ion-Atom CollisionsPhysical Review Letters, 1973
- Trace element determination with semiconductor detector x-ray spectrometersAnalytical Chemistry, 1973
- Sensitivity versus target backings for elemental analysis by alpha excited X-ray emissionNuclear Instruments and Methods, 1972
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970
- Range and stopping-power tables for heavy ionsAtomic Data and Nuclear Data Tables, 1970
- Limits for qualitative detection and quantitative determination. Application to radiochemistryAnalytical Chemistry, 1968