The development of electron spectromicroscopy
- 15 December 1995
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 75, 309-332
- https://doi.org/10.1016/0368-2048(95)02523-5
Abstract
No abstract availableKeywords
This publication has 55 references indexed in Scilit:
- A wavelength dispersive detector for synchrotron x‐ray fluorescence microprobe analysis (abstract)Review of Scientific Instruments, 1995
- Orbital and spin sum rules in x-ray magnetic circular dichroismPhysical Review B, 1994
- Synchrotron X-ray fluorescence microprobe: A microanalytical instrument for trace element studies in geochemistry, cosmochemistry, and the soil and environmental sciencesNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1994
- Soft X-ray magnetic circular dichroism and magnetic filmsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1994
- A UHV-compatible photoelectron emission microscope for applications in surface scienceUltramicroscopy, 1991
- Photoelectron microscopy with synchrotron radiationReview of Scientific Instruments, 1988
- Esca microscope — a new approach for imaging in XPSJournal of Electron Spectroscopy and Related Phenomena, 1987
- Imaging XPS—A new technique, I—principlesSurface and Interface Analysis, 1983
- Photoelectron spectromicroscopyNature, 1981
- Electron Emission MicroscopyPublished by Elsevier ,1963