Total Reflection X-ray Fluorescence Spectrometry
Open Access
- 1 January 1990
- journal article
- Published by Iron and Steel Institute of Japan in Tetsu-to-Hagane
- Vol. 76 (8) , 1228-1236
- https://doi.org/10.2355/tetsutohagane1955.76.8_1228
Abstract
No abstract availableThis publication has 38 references indexed in Scilit:
- X-ray fluorescence analysis in the ng region using total reflection of the primary beamSpectrochimica Acta Part B: Atomic Spectroscopy, 1980
- Totalreflexions-RöntgenfluoreszenzanalyseX-Ray Spectrometry, 1979
- An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb levelAnalytical and Bioanalytical Chemistry, 1978
- Total-reflection x-ray fluorescence spectrometric determination of elements in nanogram amountsAnalytical Chemistry, 1975
- A method for quantitative X-ray fluorescence analysis in the nanogram regionNuclear Instruments and Methods, 1974
- Optical Flats for Use in X-Ray Spectrochemical MicroanalysisReview of Scientific Instruments, 1971
- Interpretation of the Anomalous Surface Reflection of X RaysJournal of Applied Physics, 1965
- Anomalous Surface Reflection of X RaysPhysical Review B, 1963
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954
- CXVII. The total reflexion of X-raysJournal of Computers in Education, 1923