Time-dependent-dielectric-breakdown measurements of thermal oxides on n-type 6H-SiC
- 1 March 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 46 (3) , 520-524
- https://doi.org/10.1109/16.748871
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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