An x-ray scattering study of laterally modulated structures: the example of diblock copolymers
- 3 March 1997
- journal article
- letter
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 9 (9) , L125-L130
- https://doi.org/10.1088/0953-8984/9/9/003
Abstract
A study of the specular and off-specular (diffuse) x-ray scattering of a diblock copolymer is presented. In the ordered state the surface of the diblock copolymer is covered with islands. It is shown that the periodicity in the ordered state in the direction normal to the surface in a specular scan differs from the periodicity in the same direction observed in an off-specular scan. This result is explained by an analytical calculation of the differential cross section. The introduction of the statistical properties of the island distribution allows a complete analytical calculation of the transverse scans yielding the determination of the mean distance between the islands and the average size of an island.Keywords
This publication has 15 references indexed in Scilit:
- Evidence of Self-Affine Rough Interfaces in a Langmuir-Blodgett Film from X-Ray ReflectometryPhysical Review Letters, 1995
- Diffuse X-ray scattering of amorphous multilayersJournal de Physique III, 1994
- X-ray diffraction from laterally structured surfaces: Crystal truncation rodsJournal of Applied Physics, 1994
- Experimental study of the surface structure of diblock copolymer films using microscopy and x-ray scatteringThe Journal of Chemical Physics, 1993
- Surface scattering of x rays in thin films. Part I. Theoretical treatmentThe Journal of Chemical Physics, 1992
- X-ray-scattering study of capillary-wave fluctuations at a liquid surfacePhysical Review Letters, 1991
- X-ray and neutron reflectivity for the investigation of polymersMaterials Science Reports, 1990
- X-ray and neutron scattering from rough surfacesPhysical Review B, 1988
- Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicatesRevue de Physique Appliquée, 1980
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954